2014

5 - Wigner and Kondo physics in quantum point contacts revealed by scanning gate microscopy,
B. Brun, F. Martins, S. Faniel, B. Hackens, G. Bachelier, A. Cavanna, C. Ulysse, A. Ouerghi, U. Gennser, D. Mailly, S. Huant, V. Bayot, M. Sanquer, H. Sellier,
Nature Com., 5, 4290 (2014): Free pdf.

2008

4 - Background-free apertureless near-field optical imaging,
P. G. Gucciardi, G. Bachelier, S. J. Stranick and M. Allegrini,
Applied Scanning Probe Methods VIII, edited by B. Bhushan, C. Fuchs and S. Kawata, Springer-Verlag, New-York, 6, 1 (2008).

2007

3 - Artifacts identification in apertureless near-field optical microscopy,
P.G. Gucciardi, G. Bachelier, M. Allegrini, J. Ahn, M. Hong, S. Chang, W. Jhe, S. C. Hong and S. H. Baek ,
J. of Appl. Phys., 101, 64303 (2007).

2006

2 - Far-field background suppression in tip-modulated apertureless near-field optical microscopy,
P. Gucciardi, G. Bachelier and M. Allegrini,
J. Appl. Phys., 99, 124309 (2006).

2005

1 - Interferometric measurement of the tip oscillation amplitude in apertureless near-field optical microscopy,
P. Gucciardi, G. Bachelier, A. Mlayah and M. Allegrini,
Rev. Sci. Instrum., 76, 36105 (2005).